Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long Lifespan Systems

Jaber Al Rashid (1, 2, 3) , Mohsen Koohestani (2, 3) , Richard Perdriau (2, 3) , Laurent Saintis (1) , Mihaela Barreau (1)

1 LARIS - Laboratoire Angevin de Recherche en Ingénierie des Systèmes
2 IETR - Institut d'Électronique et des Technologies du numéRique
3 RF-EMC - ESEO - RF-EMC

This paper compares the electromagnetic compatibility (EMC) performance of three different voltage regulator ICs (i.e. UA78L05, L78L05 and MC78L05) developed by three different manufacturers, with similar functionality and pin compatibility, under the influence of low and high temperature stress conditions (i.e. –30∘C and +100∘C). Direct power injection (DPI) was performed on these ICs to analyze the impact of applying thermal stress on the conducted immunity to the injection of single-tone RF disturbance signal. The DPI immunity parameters were measured and recorded in real-time for an incident amplified power, while the ICs were exposed to low and high thermal stress conditions. It was demonstrated that the minimum injected power required to reach the defined failure threshold voltage criterion (±4%) varied over frequency depending on the ICs. Moreover, these functionally identical ICs showed significant evolution of their conducted immunity in all the considered temperatures, depending on their manufacturer. Input impedance curves were monitored at low, high and nominal temperature, showing noticeable decline of impedance at high frequency. Moreover, the equivalent RLC values of the lumped elements (i.e. resistor, inductor and capacitor) were extracted and compared at these aforementioned temperature conditions to model the power supply network impedance for the selected ICs. The immunity behaviour of these ICs was further investigated by generating look up table data from the DPI measurements.

Mots clés: DPI; conducted immunity; obsolescence; thermal stress; failure criterion

Domaines: Sciences de l'ingénieur [physics]

Jaber Al Rashid, Mohsen Koohestani, Richard Perdriau, Laurent Saintis, Mihaela Barreau. Combining Obsolescence and Temperature Stress to Evaluate the Immunity of Voltage Regulators to Direct Power Injection in Long Lifespan Systems. IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2023, ⟨10.1109/LEMCPA.2023.3240621⟩. ⟨hal-03993665v1⟩